No part of a product life cycle is immune to time-to-market pressures, and that includes wafer-level parametric tests on scribe-line test structures. Parallel parametric test is emerging as a ...
Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
Cleveland, Ohio — Keithley Instruments, Inc. has announced the availability of its Automated Characterization Suite (ACS) V3.2 software for semiconductor test and characterization at the device, wafer ...
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